TEST_NAME : Wafer
TEST_DATE : 24_09_10-17_28_39
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-023-015-019-02 | FUSED_ID : 6359364768397062450
  IC_TEMP :  -56.43 | VDDM : 1117.93 | AUX_INT :   -7.67 | CsaBias :   59.22
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.15254e-03 / 2
  ADC_P0  : -7.67333e-03 ± 2.29510e-02
  ADC_P1  : 8.41234e-03 ± 5.56572e-04
  ADC_P2  : -6.34462e-06 ± 2.67656e-06
  CSA_Chi2/NDF : 1.57437e-04 / 2
  CSA_P0  : 5.88250e-02 ± 8.36904e-03
  CSA_P1  : 1.02841e-02 ± 6.30547e-04
  CSA_P2  : -5.29858e-05 ± 9.60249e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  7
 | N_BROKEN_FAST :  [12, 30, 40, 50, 60, 93, 115]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  6
 | P_BROKEN_FAST :  [42, 43, 54, 61, 68, 119]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.4817', '1.800', '0.1809', '1.800', '0.0942', '7.000', '0.7083', 1, 1, 1, 1, 1725982119.2919471]
VI_after__Init : ['1.202', '0.4811', '1.800', '0.1809', '1.800', '0.0884', '7.000', '0.7081', 1, 1, 1, 1, 1725982127.3303528]
VI_at__the_End : ['1.202', '0.4926', '1.800', '0.1385', '1.802', '0.1124', '7.000', '0.7086', 1, 1, 1, 1, 1725982187.7546997]