TEST_NAME : Wafer
TEST_DATE : 24_09_10-17_22_11
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-023-015-023-02 | FUSED_ID : 6359364768397062514
  IC_TEMP :  -48.47 | VDDM : 1124.75 | AUX_INT :   -5.70 | CsaBias :   73.30
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 8.89815e-04 / 2
  ADC_P0  : -5.69504e-03 ± 2.02131e-02
  ADC_P1  : 7.94721e-03 ± 4.80895e-04
  ADC_P2  : -4.75759e-06 ± 2.26412e-06
  CSA_Chi2/NDF : 8.22202e-05 / 2
  CSA_P0  : 5.96459e-02 ± 6.04800e-03
  CSA_P1  : 9.47994e-03 ± 4.55673e-04
  CSA_P2  : -3.76460e-05 ± 6.93936e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  6
 | N_BROKEN_FAST :  [7, 27, 85, 91, 107, 118]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  8
 | P_BROKEN_FAST :  [10, 14, 22, 23, 39, 62, 70, 101]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.0953', '1.800', '0.1655', '1.800', '0.0808', '7.000', '0.7092', 1, 1, 1, 1, 1725981731.2462702]
VI_after__Init : ['1.202', '0.0953', '1.800', '0.1654', '1.800', '0.0733', '7.000', '0.7078', 1, 1, 1, 1, 1725981739.337643]
VI_at__the_End : ['1.202', '0.5043', '1.800', '0.1375', '1.801', '0.1097', '7.000', '0.7089', 1, 1, 1, 1, 1725981796.4263556]