TEST_NAME : Wafer
TEST_DATE : 24_09_10-18_04_12
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-023-016-012-13 | FUSED_ID : 6359364768397066445
  IC_TEMP :  -47.91 | VDDM : 1114.66 | AUX_INT :   -5.73 | CsaBias :   88.09
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 8.65497e-04 / 2
  ADC_P0  : -5.73198e-03 ± 1.99639e-02
  ADC_P1  : 7.86795e-03 ± 4.79950e-04
  ADC_P2  : -4.12651e-06 ± 2.27985e-06
  CSA_Chi2/NDF : 1.01035e-04 / 2
  CSA_P0  : 5.99214e-02 ± 6.70438e-03
  CSA_P1  : 9.44672e-03 ± 5.05127e-04
  CSA_P2  : -3.88105e-05 ± 7.69248e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  5
 | N_BROKEN_FAST :  [17, 24, 88, 97, 104]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  5
 | P_BROKEN_FAST :  [4, 44, 71, 96, 108]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.1695', '1.800', '0.1560', '1.799', '0.0862', '7.000', '0.7076', 1, 1, 1, 1, 1725984252.104085]
VI_after__Init : ['1.202', '0.1695', '1.800', '0.1560', '1.801', '0.0808', '7.000', '0.7077', 1, 1, 1, 1, 1725984260.84545]
VI_at__the_End : ['1.202', '0.4995', '1.800', '0.1405', '1.804', '0.1124', '7.000', '0.7085', 1, 1, 1, 1, 1725984327.7391188]