TEST_NAME : Wafer
TEST_DATE : 24_09_10-18_05_49
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-023-016-013-13 | FUSED_ID : 6359364768397066461
  IC_TEMP :  -46.79 | VDDM : 1129.83 | AUX_INT :   -7.34 | CsaBias :   85.19
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.29415e-03 / 2
  ADC_P0  : -7.33951e-03 ± 2.44191e-02
  ADC_P1  : 7.76285e-03 ± 5.66832e-04
  ADC_P2  : -4.34579e-06 ± 2.61614e-06
  CSA_Chi2/NDF : 5.80781e-05 / 2
  CSA_P0  : 5.84189e-02 ± 5.08310e-03
  CSA_P1  : 9.07585e-03 ± 3.82975e-04
  CSA_P2  : -3.41394e-05 ± 5.83225e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  4
 | N_BROKEN_FAST :  [52, 77, 91, 123]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  5
 | P_BROKEN_FAST :  [22, 42, 49, 67, 71]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.3082', '1.800', '0.1368', '1.800', '0.0926', '7.000', '0.7079', 1, 1, 1, 1, 1725984349.2404172]
VI_after__Init : ['1.202', '0.3085', '1.800', '0.1368', '1.799', '0.0868', '7.000', '0.7079', 1, 1, 1, 1, 1725984357.2867894]
VI_at__the_End : ['1.202', '0.4931', '1.800', '0.1361', '1.801', '0.1112', '7.000', '0.7084', 1, 1, 1, 1, 1725984413.47731]