TEST_NAME : Wafer
TEST_DATE : 24_09_10-18_07_26
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-023-016-014-13 | FUSED_ID : 6359364768397066477
  IC_TEMP :  -49.98 | VDDM : 1113.45 | AUX_INT :   -4.30 | CsaBias :   83.03
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 5.88606e-04 / 2
  ADC_P0  : -4.30335e-03 ± 1.64038e-02
  ADC_P1  : 7.99498e-03 ± 3.92235e-04
  ADC_P2  : -5.05597e-06 ± 1.84789e-06
  CSA_Chi2/NDF : 7.43655e-05 / 2
  CSA_P0  : 5.98471e-02 ± 5.75186e-03
  CSA_P1  : 9.30246e-03 ± 4.33361e-04
  CSA_P2  : -3.66512e-05 ± 6.59957e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  4
 | N_BROKEN_FAST :  [53, 71, 81, 94]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  8
 | P_BROKEN_FAST :  [12, 19, 39, 45, 50, 70, 82, 96]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.1262', '1.800', '0.1578', '1.800', '0.0794', '7.000', '0.7078', 1, 1, 1, 1, 1725984445.563866]
VI_after__Init : ['1.202', '0.1263', '1.800', '0.1578', '1.801', '0.0742', '7.000', '0.7076', 1, 1, 1, 1, 1725984454.315219]
VI_at__the_End : ['1.202', '0.4973', '1.800', '0.1391', '1.801', '0.1107', '7.000', '0.7086', 1, 1, 1, 1, 1725984521.15493]