TEST_NAME : Wafer
TEST_DATE : 24_09_10-18_09_03
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-023-016-015-13 | FUSED_ID : 6359364768397066493
  IC_TEMP :  -51.14 | VDDM : 1135.59 | AUX_INT :   -5.98 | CsaBias :   80.74
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 8.95297e-04 / 2
  ADC_P0  : -5.97596e-03 ± 2.02841e-02
  ADC_P1  : 7.93521e-03 ± 4.83538e-04
  ADC_P2  : -4.75192e-06 ± 2.27430e-06
  CSA_Chi2/NDF : 5.84221e-05 / 2
  CSA_P0  : 6.05069e-02 ± 5.09813e-03
  CSA_P1  : 9.11616e-03 ± 3.84107e-04
  CSA_P2  : -3.36956e-05 ± 5.84950e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  5
 | N_BROKEN_FAST :  [0, 1, 32, 59, 106]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  4
 | P_BROKEN_FAST :  [10, 72, 102, 117]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.4176', '1.800', '0.1606', '1.799', '0.0919', '7.000', '0.7077', 1, 1, 1, 1, 1725984542.4063048]
VI_after__Init : ['1.202', '0.4177', '1.800', '0.1606', '1.801', '0.0864', '7.000', '0.7080', 1, 1, 1, 1, 1725984551.2816129]
VI_at__the_End : ['1.202', '0.4984', '1.800', '0.1357', '1.808', '0.1098', '7.000', '0.7084', 1, 1, 1, 1, 1725984618.8312733]