TEST_NAME : Wafer
TEST_DATE : 24_09_10-18_12_16
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-023-016-017-10 | FUSED_ID : 6359364768397066522
  IC_TEMP :  -48.24 | VDDM : 1129.00 | AUX_INT :   -7.85 | CsaBias :   92.53
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.49811e-03 / 2
  ADC_P0  : -7.85321e-03 ± 2.63208e-02
  ADC_P1  : 7.77620e-03 ± 6.17259e-04
  ADC_P2  : -4.19306e-06 ± 2.87127e-06
  CSA_Chi2/NDF : 7.11545e-05 / 2
  CSA_P0  : 5.82727e-02 ± 5.62631e-03
  CSA_P1  : 9.33080e-03 ± 4.23902e-04
  CSA_P2  : -3.70000e-05 ± 6.45552e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  4
 | N_BROKEN_FAST :  [11, 45, 113, 119]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  7
 | P_BROKEN_FAST :  [12, 24, 71, 75, 87, 93, 117]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.2886', '1.800', '0.1349', '1.799', '0.0831', '7.000', '0.7077', 1, 1, 1, 1, 1725984736.113221]
VI_after__Init : ['1.202', '0.2886', '1.800', '0.1350', '1.800', '0.0779', '7.000', '0.7076', 1, 1, 1, 1, 1725984744.9485373]
VI_at__the_End : ['1.201', '0.4941', '1.800', '0.1342', '1.799', '0.1107', '7.000', '0.7086', 1, 1, 1, 1, 1725984812.1862957]