TEST_NAME : Wafer
TEST_DATE : 24_09_10-18_13_53
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-023-016-018-10 | FUSED_ID : 6359364768397066538
  IC_TEMP :  -46.53 | VDDM : 1129.87 | AUX_INT :   -9.08 | CsaBias :   85.32
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.40300e-03 / 2
  ADC_P0  : -9.08107e-03 ± 2.54316e-02
  ADC_P1  : 7.31109e-03 ± 5.53546e-04
  ADC_P2  : -3.80429e-06 ± 2.40487e-06
  CSA_Chi2/NDF : 1.07210e-04 / 2
  CSA_P0  : 5.72380e-02 ± 6.90622e-03
  CSA_P1  : 9.69747e-03 ± 5.20334e-04
  CSA_P2  : -4.02736e-05 ± 7.92407e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  6
 | N_BROKEN_FAST :  [28, 48, 55, 72, 109, 115]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  4
 | P_BROKEN_FAST :  [5, 22, 107, 111]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.1997', '1.800', '0.1351', '1.800', '0.0842', '7.000', '0.7086', 1, 1, 1, 1, 1725984832.9406652]
VI_after__Init : ['1.202', '0.1997', '1.800', '0.1352', '1.800', '0.0768', '7.000', '0.7079', 1, 1, 1, 1, 1725984840.9470634]
VI_at__the_End : ['1.202', '0.5065', '1.800', '0.1335', '1.803', '0.1097', '7.000', '0.7086', 1, 1, 1, 1, 1725984908.368855]