TEST_NAME : Wafer
TEST_DATE : 24_09_10-18_15_30
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-023-016-019-10 | FUSED_ID : 6359364768397066554
  IC_TEMP :  -54.73 | VDDM : 1131.63 | AUX_INT :   -7.01 | CsaBias :   81.97
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.01308e-03 / 2
  ADC_P0  : -7.00798e-03 ± 2.15528e-02
  ADC_P1  : 8.14916e-03 ± 5.18766e-04
  ADC_P2  : -5.44985e-06 ± 2.46612e-06
  CSA_Chi2/NDF : 9.64230e-05 / 2
  CSA_P0  : 5.81957e-02 ± 6.54957e-03
  CSA_P1  : 9.70184e-03 ± 4.93463e-04
  CSA_P2  : -4.19663e-05 ± 7.51485e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  4
 | N_BROKEN_FAST :  [44, 50, 110, 114]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  6
 | P_BROKEN_FAST :  [4, 11, 50, 52, 98, 120]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.4224', '1.800', '0.1311', '1.800', '0.0961', '7.000', '0.7077', 1, 1, 1, 1, 1725984930.077172]
VI_after__Init : ['1.201', '0.4221', '1.800', '0.1310', '1.800', '0.0908', '7.000', '0.7077', 1, 1, 1, 1, 1725984938.1755838]
VI_at__the_End : ['1.202', '0.4989', '1.800', '0.1359', '1.804', '0.1112', '7.000', '0.7085', 1, 1, 1, 1, 1725985005.2524486]