TEST_NAME : Wafer
TEST_DATE : 24_09_10-18_17_06
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-023-016-020-10 | FUSED_ID : 6359364768397066570
  IC_TEMP :  -56.11 | VDDM : 1137.45 | AUX_INT : -127.47 | CsaBias :   -6.63
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.06274e-03 / 2
  ADC_P0  : -1.27467e-01 ± 2.77809e-02
  ADC_P1  : 1.02162e-02 ± 6.58162e-04
  ADC_P2  : -1.21808e-05 ± 3.05120e-06
  CSA_Chi2/NDF : 1.15188e-04 / 2
  CSA_P0  : 5.85357e-02 ± 7.15857e-03
  CSA_P1  : 9.71274e-03 ± 5.39347e-04
  CSA_P2  : -4.16660e-05 ± 8.21361e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  10
 | N_BROKEN_FAST :  [1, 15, 33, 37, 49, 91, 95, 105, 116, 122]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  7
 | P_BROKEN_FAST :  [2, 18, 60, 77, 86, 106, 120]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.2855', '1.800', '0.1356', '1.800', '0.0844', '7.000', '0.7079', 1, 1, 1, 1, 1725985026.3177872]
VI_after__Init : ['1.201', '0.2852', '1.800', '0.1356', '1.800', '0.0786', '7.000', '0.7079', 1, 1, 1, 1, 1725985034.4691556]
VI_at__the_End : ['1.201', '0.4990', '1.800', '0.1364', '1.800', '0.1106', '7.000', '0.7088', 1, 1, 1, 1, 1725985096.2644897]