TEST_NAME : Wafer
TEST_DATE : 24_09_10-18_46_11
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-023-017-008-00 | FUSED_ID : 6359364768397070464
  IC_TEMP :  -51.25 | VDDM : 1124.13 | AUX_INT :  -36.41 | CsaBias :   60.80
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.54436e-03 / 2
  ADC_P0  : -3.64055e-02 ± 2.80971e-02
  ADC_P1  : 8.92041e-03 ± 6.87632e-04
  ADC_P2  : -7.59440e-06 ± 3.32844e-06
  CSA_Chi2/NDF : 9.44720e-05 / 2
  CSA_P0  : 5.95039e-02 ± 6.48297e-03
  CSA_P1  : 9.44601e-03 ± 4.88445e-04
  CSA_P2  : -3.80689e-05 ± 7.43844e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  4
 | N_BROKEN_FAST :  [34, 86, 87, 107]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  5
 | P_BROKEN_FAST :  [31, 53, 111, 112, 116]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.3322', '1.800', '0.1510', '1.799', '0.0888', '7.000', '0.7076', 1, 1, 1, 1, 1725986770.565263]
VI_after__Init : ['1.201', '0.3323', '1.800', '0.1510', '1.800', '0.0830', '7.000', '0.7074', 1, 1, 1, 1, 1725986779.3355453]
VI_at__the_End : ['1.202', '0.5010', '1.800', '0.1378', '1.800', '0.1104', '7.000', '0.7084', 1, 1, 1, 1, 1725986839.4538321]