TEST_NAME : Wafer
TEST_DATE : 24_09_10-18_44_33
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-023-017-009-00 | FUSED_ID : 6359364768397070480
  IC_TEMP :  -51.30 | VDDM : 1128.09 | AUX_INT :   -7.79 | CsaBias :   86.08
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.10055e-03 / 2
  ADC_P0  : -7.78525e-03 ± 2.24948e-02
  ADC_P1  : 7.87721e-03 ± 5.28057e-04
  ADC_P2  : -4.61208e-06 ± 2.46258e-06
  CSA_Chi2/NDF : 8.76256e-05 / 2
  CSA_P0  : 5.93849e-02 ± 6.24364e-03
  CSA_P1  : 9.58920e-03 ± 4.70413e-04
  CSA_P2  : -3.96143e-05 ± 7.16383e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  7
 | N_BROKEN_FAST :  [30, 60, 69, 79, 82, 89, 96]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  5
 | P_BROKEN_FAST :  [11, 18, 22, 89, 94]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.1335', '1.800', '0.1293', '1.800', '0.0828', '7.000', '0.7076', 1, 1, 1, 1, 1725986673.6560397]
VI_after__Init : ['1.202', '0.1335', '1.800', '0.1293', '1.800', '0.0772', '7.000', '0.7078', 1, 1, 1, 1, 1725986681.728398]
VI_at__the_End : ['1.201', '0.5030', '1.800', '0.1372', '1.800', '0.1117', '7.000', '0.7085', 1, 1, 1, 1, 1725986749.7549531]