TEST_NAME : Wafer
TEST_DATE : 24_09_10-18_41_19
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-023-017-011-00 | FUSED_ID : 6359364768397070512
  IC_TEMP :  -54.77 | VDDM : 1135.61 | AUX_INT :   -7.85 | CsaBias :   81.92
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.16222e-03 / 2
  ADC_P0  : -7.85062e-03 ± 2.31089e-02
  ADC_P1  : 8.22054e-03 ± 5.59882e-04
  ADC_P2  : -5.44134e-06 ± 2.68846e-06
  CSA_Chi2/NDF : 1.25389e-04 / 2
  CSA_P0  : 5.99953e-02 ± 7.46884e-03
  CSA_P1  : 9.77548e-03 ± 5.62723e-04
  CSA_P2  : -4.20069e-05 ± 8.56960e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  9
 | N_BROKEN_FAST :  [1, 39, 40, 46, 57, 70, 73, 108, 127]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  4
 | P_BROKEN_FAST :  [8, 27, 67, 124]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3099', '1.800', '0.1483', '1.799', '0.0882', '7.000', '0.7078', 1, 1, 1, 1, 1725986478.9799006]
VI_after__Init : ['1.202', '0.3100', '1.800', '0.1483', '1.800', '0.0824', '7.000', '0.7077', 1, 1, 1, 1, 1725986487.9260592]
VI_at__the_End : ['1.201', '0.5034', '1.800', '0.1406', '1.800', '0.1125', '7.000', '0.7089', 1, 1, 1, 1, 1725986547.4892228]