TEST_NAME : Wafer
TEST_DATE : 24_09_10-18_34_52
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-023-017-015-00 | FUSED_ID : 6359364768397070576
  IC_TEMP :  -49.67 | VDDM : 1123.46 | AUX_INT :   -8.51 | CsaBias :   81.21
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.10892e-03 / 2
  ADC_P0  : -8.50798e-03 ± 2.25295e-02
  ADC_P1  : 8.21843e-03 ± 5.39969e-04
  ADC_P2  : -5.63638e-06 ± 2.57156e-06
  CSA_Chi2/NDF : 9.72390e-05 / 2
  CSA_P0  : 5.95320e-02 ± 6.57722e-03
  CSA_P1  : 9.67868e-03 ± 4.95546e-04
  CSA_P2  : -4.18603e-05 ± 7.54658e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  7
 | N_BROKEN_FAST :  [4, 13, 20, 87, 103, 111, 127]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  7
 | P_BROKEN_FAST :  [26, 31, 43, 51, 85, 110, 126]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.3580', '1.800', '0.1732', '1.800', '0.0898', '7.000', '0.7089', 1, 1, 1, 1, 1725986091.9483392]
VI_after__Init : ['1.202', '0.3576', '1.800', '0.1735', '1.800', '0.0821', '7.000', '0.7083', 1, 1, 1, 1, 1725986099.9696887]
VI_at__the_End : ['1.202', '0.4978', '1.800', '0.1387', '1.800', '0.1111', '7.000', '0.7087', 1, 1, 1, 1, 1725986167.6328573]