TEST_NAME : Wafer
TEST_DATE : 24_09_10-18_31_37
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-023-017-017-07 | FUSED_ID : 6359364768397070615
  IC_TEMP :  -46.67 | VDDM : 1131.28 | AUX_INT :  -24.19 | CsaBias :   77.16
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.31264e-03 / 2
  ADC_P0  : -2.41885e-02 ± 2.54129e-02
  ADC_P1  : 7.86092e-03 ± 5.75638e-04
  ADC_P2  : -4.97176e-06 ± 2.58563e-06
  CSA_Chi2/NDF : 7.57982e-05 / 2
  CSA_P0  : 5.94054e-02 ± 5.80700e-03
  CSA_P1  : 9.50234e-03 ± 4.37516e-04
  CSA_P2  : -3.76405e-05 ± 6.66285e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  6
 | N_BROKEN_FAST :  [7, 13, 16, 19, 49, 63]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  7
 | P_BROKEN_FAST :  [27, 30, 42, 70, 90, 105, 121]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.0924', '1.800', '0.1572', '1.800', '0.0822', '7.000', '0.7082', 1, 1, 1, 1, 1725985897.4511309]
VI_after__Init : ['1.202', '0.0923', '1.800', '0.1572', '1.799', '0.0766', '7.000', '0.7079', 1, 1, 1, 1, 1725985905.6015198]
VI_at__the_End : ['1.202', '0.5048', '1.800', '0.1339', '1.804', '0.1103', '7.000', '0.7088', 1, 1, 1, 1, 1725985971.4144154]