TEST_NAME : Wafer
TEST_DATE : 24_09_10-18_28_23
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-023-017-019-07 | FUSED_ID : 6359364768397070647
  IC_TEMP :  -53.39 | VDDM : 1125.05 | AUX_INT :   -8.49 | CsaBias :   92.61
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.31264e-03 / 2
  ADC_P0  : -8.48651e-03 ± 2.45688e-02
  ADC_P1  : 7.84104e-03 ± 5.65670e-04
  ADC_P2  : -4.97176e-06 ± 2.58563e-06
  CSA_Chi2/NDF : 8.38242e-05 / 2
  CSA_P0  : 5.71814e-02 ± 6.10671e-03
  CSA_P1  : 9.36877e-03 ± 4.60096e-04
  CSA_P2  : -3.72887e-05 ± 7.00672e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  4
 | N_BROKEN_FAST :  [1, 2, 61, 103]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  8
 | P_BROKEN_FAST :  [0, 2, 5, 49, 57, 72, 80, 102]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.2947', '1.800', '0.1704', '1.799', '0.0898', '7.000', '0.7080', 1, 1, 1, 1, 1725985703.124987]
VI_after__Init : ['1.202', '0.2946', '1.800', '0.1704', '1.800', '0.0842', '7.000', '0.7079', 1, 1, 1, 1, 1725985711.2683775]
VI_at__the_End : ['1.202', '0.4959', '1.800', '0.1363', '1.800', '0.1118', '7.000', '0.7088', 1, 1, 1, 1, 1725985779.7471547]