TEST_NAME : Wafer
TEST_DATE : 24_09_10-18_49_25
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-023-018-009-14 | FUSED_ID : 6359364768397074590
  IC_TEMP :  -56.25 | VDDM : 1123.44 | AUX_INT :   -6.52 | CsaBias :   77.03
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 8.55364e-04 / 2
  ADC_P0  : -6.51508e-03 ± 1.97873e-02
  ADC_P1  : 8.41267e-03 ± 4.91902e-04
  ADC_P2  : -5.86402e-06 ± 2.41156e-06
  CSA_Chi2/NDF : 1.13146e-04 / 2
  CSA_P0  : 5.94265e-02 ± 7.09484e-03
  CSA_P1  : 9.38617e-03 ± 5.34545e-04
  CSA_P2  : -3.85321e-05 ± 8.14049e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  6
 | N_BROKEN_FAST :  [12, 19, 39, 68, 108, 117]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  6
 | P_BROKEN_FAST :  [5, 6, 20, 23, 123, 127]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.3508', '1.800', '0.1410', '1.800', '0.0926', '7.000', '0.7074', 1, 1, 1, 1, 1725986964.885895]
VI_after__Init : ['1.202', '0.3507', '1.800', '0.1409', '1.800', '0.0869', '7.000', '0.7076', 1, 1, 1, 1, 1725986972.959234]
VI_at__the_End : ['1.201', '0.4945', '1.800', '0.1382', '1.800', '0.1142', '7.000', '0.7083', 1, 1, 1, 1, 1725987039.4459934]