TEST_NAME : Wafer
TEST_DATE : 24_09_10-18_52_40
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-023-018-011-14 | FUSED_ID : 6359364768397074622
  IC_TEMP :  -51.69 | VDDM : 1122.32 | AUX_INT :   -8.10 | CsaBias :   81.77
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.10856e-03 / 2
  ADC_P0  : -8.10345e-03 ± 2.25119e-02
  ADC_P1  : 8.23729e-03 ± 5.36191e-04
  ADC_P2  : -6.09167e-06 ± 2.52600e-06
  CSA_Chi2/NDF : 9.60504e-05 / 2
  CSA_P0  : 5.84004e-02 ± 6.53690e-03
  CSA_P1  : 9.28493e-03 ± 4.92508e-04
  CSA_P2  : -3.66617e-05 ± 7.50032e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  7
 | N_BROKEN_FAST :  [8, 14, 36, 81, 95, 109, 120]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  6
 | P_BROKEN_FAST :  [8, 55, 57, 58, 102, 111]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.1495', '1.800', '0.1517', '1.800', '0.0793', '7.000', '0.7072', 1, 1, 1, 1, 1725987159.6774445]
VI_after__Init : ['1.202', '0.1495', '1.800', '0.1516', '1.800', '0.0734', '6.999', '0.7074', 1, 1, 1, 1, 1725987167.6668394]
VI_at__the_End : ['1.201', '0.4962', '1.800', '0.1368', '1.800', '0.1093', '7.000', '0.7082', 1, 1, 1, 1, 1725987227.5031812]