TEST_NAME : Wafer
TEST_DATE : 24_09_10-18_54_17
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-023-018-012-14 | FUSED_ID : 6359364768397074638
  IC_TEMP :  -50.93 | VDDM : 1126.48 | AUX_INT :   -8.09 | CsaBias :   87.58
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.26583e-03 / 2
  ADC_P0  : -8.08845e-03 ± 2.41754e-02
  ADC_P1  : 8.02370e-03 ± 5.85832e-04
  ADC_P2  : -4.26236e-06 ± 2.82698e-06
  CSA_Chi2/NDF : 1.59852e-04 / 2
  CSA_P0  : 6.01622e-02 ± 8.43299e-03
  CSA_P1  : 1.01549e-02 ± 6.35365e-04
  CSA_P2  : -4.59745e-05 ± 9.67586e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  6
 | N_BROKEN_FAST :  [24, 38, 61, 85, 94, 114]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  8
 | P_BROKEN_FAST :  [15, 39, 45, 48, 62, 65, 98, 117]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.4186', '1.800', '0.1650', '1.800', '0.0910', '7.000', '0.7072', 1, 1, 1, 1, 1725987256.743967]
VI_after__Init : ['1.201', '0.4183', '1.800', '0.1650', '1.800', '0.0852', '7.000', '0.7072', 1, 1, 1, 1, 1725987265.0023265]
VI_at__the_End : ['1.196', '0.5079', '1.800', '0.1406', '1.800', '0.1113', '7.000', '0.7078', 1, 1, 1, 1, 1725987333.001992]