TEST_NAME : Wafer
TEST_DATE : 24_09_10-18_55_53
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-023-018-013-14 | FUSED_ID : 6359364768397074654
  IC_TEMP :  -53.59 | VDDM : 1132.27 | AUX_INT :  -36.40 | CsaBias :   50.78
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.75785e-03 / 2
  ADC_P0  : -3.63975e-02 ± 2.99938e-02
  ADC_P1  : 8.79010e-03 ± 7.25582e-04
  ADC_P2  : -7.24667e-06 ± 3.47463e-06
  CSA_Chi2/NDF : 1.41192e-04 / 2
  CSA_P0  : 6.20421e-02 ± 7.92551e-03
  CSA_P1  : 1.01804e-02 ± 5.97130e-04
  CSA_P2  : -4.74509e-05 ± 9.09358e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  7
 | N_BROKEN_FAST :  [5, 17, 31, 48, 57, 89, 119]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  6
 | P_BROKEN_FAST :  [4, 18, 85, 98, 102, 123]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.1921', '1.800', '0.1650', '1.800', '0.0858', '7.000', '0.7072', 1, 1, 1, 1, 1725987353.319464]
VI_after__Init : ['1.202', '0.1922', '1.800', '0.1648', '1.800', '0.0800', '7.000', '0.7069', 1, 1, 1, 1, 1725987361.4887762]
VI_at__the_End : ['1.201', '0.5116', '1.800', '0.1418', '1.800', '0.1107', '7.000', '0.7080', 1, 1, 1, 1, 1725987430.455436]