TEST_NAME : Wafer
TEST_DATE : 24_09_10-19_00_44
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
------------------------------------------------------------
------------------------------------------------------------
ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-023-018-016-09 | FUSED_ID : 6359364768397074697
  IC_TEMP :  -51.60 | VDDM : 1124.07 | AUX_INT :   -7.66 | CsaBias :   81.82
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.05723e-03 / 2
  ADC_P0  : -7.66204e-03 ± 2.20010e-02
  ADC_P1  : 8.19823e-03 ± 5.26780e-04
  ADC_P2  : -5.78537e-06 ± 2.49293e-06
  CSA_Chi2/NDF : 1.07211e-04 / 2
  CSA_P0  : 5.93674e-02 ± 6.90625e-03
  CSA_P1  : 9.62306e-03 ± 5.20336e-04
  CSA_P2  : -3.96270e-05 ± 7.92410e-06
------------------------------------------------------------
ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  6
 | N_BROKEN_FAST :  [4, 23, 41, 76, 111, 112]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  6
 | P_BROKEN_FAST :  [68, 94, 102, 104, 115, 119]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
------------------------------------------------------------
------------------------------------------------------------
VI_before_Init : ['1.201', '0.1952', '1.800', '0.1380', '1.800', '0.0906', '7.000', '0.7072', 1, 1, 1, 1, 1725987644.4667876]
VI_after__Init : ['1.202', '0.1952', '1.800', '0.1380', '1.800', '0.0849', '7.000', '0.7069', 1, 1, 1, 1, 1725987652.685083]
VI_at__the_End : ['1.201', '0.5047', '1.800', '0.1386', '1.800', '0.1106', '7.000', '0.7080', 1, 1, 1, 1, 1725987720.227972]