TEST_NAME : Wafer
TEST_DATE : 24_09_11-17_16_29
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
------------------------------------------------------------
------------------------------------------------------------
ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-024-005-005-15 | FUSED_ID : 6359364768398069855
  IC_TEMP :  -59.85 | VDDM : 1124.50 | AUX_INT :   -7.84 | CsaBias :   78.31
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.10952e-03 / 2
  ADC_P0  : -7.83558e-03 ± 2.25509e-02
  ADC_P1  : 8.67802e-03 ± 5.73298e-04
  ADC_P2  : -6.31715e-06 ± 2.88545e-06
  CSA_Chi2/NDF : 1.54191e-04 / 2
  CSA_P0  : 5.85800e-02 ± 8.28233e-03
  CSA_P1  : 1.00443e-02 ± 6.24014e-04
  CSA_P2  : -4.72188e-05 ± 9.50299e-06
------------------------------------------------------------
ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  8
 | N_BROKEN_FAST :  [13, 39, 48, 52, 77, 118, 122, 127]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  5
 | P_BROKEN_FAST :  [18, 39, 40, 56, 126]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
------------------------------------------------------------
------------------------------------------------------------
VI_before_Init : ['1.202', '0.2397', '1.800', '0.1350', '1.800', '0.0909', '7.000', '0.7073', 1, 1, 1, 1, 1726067788.4440172]
VI_after__Init : ['1.202', '0.2398', '1.800', '0.1350', '1.801', '0.0858', '7.000', '0.7070', 1, 1, 1, 1, 1726067796.6873064]
VI_at__the_End : ['1.202', '0.4976', '1.800', '0.1418', '1.799', '0.1138', '7.000', '0.7081', 1, 1, 1, 1, 1726067862.2622292]