TEST_NAME : Wafer
TEST_DATE : 24_09_11-16_53_51
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-024-005-019-08 | FUSED_ID : 6359364768398070072
  IC_TEMP :  -58.42 | VDDM : 1122.15 | AUX_INT :  -10.06 | CsaBias :   74.54
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.63603e-03 / 2
  ADC_P0  : -1.00627e-02 ± 2.74152e-02
  ADC_P1  : 8.52194e-03 ± 6.75188e-04
  ADC_P2  : -6.19596e-06 ± 3.31091e-06
  CSA_Chi2/NDF : 1.62241e-04 / 2
  CSA_P0  : 5.94475e-02 ± 8.49576e-03
  CSA_P1  : 1.00998e-02 ± 6.40094e-04
  CSA_P2  : -4.98488e-05 ± 9.74788e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  6
 | N_BROKEN_FAST :  [28, 41, 82, 98, 122, 125]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  4
 | P_BROKEN_FAST :  [46, 60, 78, 103]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3540', '1.800', '0.1428', '1.800', '0.1022', '7.000', '0.7086', 1, 1, 1, 1, 1726066431.654585]
VI_after__Init : ['1.202', '0.3543', '1.800', '0.1429', '1.800', '0.0950', '7.000', '0.7076', 1, 1, 1, 1, 1726066439.7790754]
VI_at__the_End : ['1.202', '0.4944', '1.800', '0.1393', '1.800', '0.1152', '7.000', '0.7084', 1, 1, 1, 1, 1726066498.6876829]