TEST_NAME : Wafer
TEST_DATE : 24_09_12-00_40_46
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-024-017-015-05 | FUSED_ID : 6359364768398119157
  IC_TEMP :  -66.18 | VDDM : 1115.36 | AUX_INT :  -11.64 | CsaBias :   71.26
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 2.37844e-03 / 2
  ADC_P0  : -1.16418e-02 ± 3.31623e-02
  ADC_P1  : 8.34605e-03 ± 8.03216e-04
  ADC_P2  : -5.55161e-06 ± 3.89385e-06
  CSA_Chi2/NDF : 2.04254e-04 / 2
  CSA_P0  : 5.96605e-02 ± 9.53251e-03
  CSA_P1  : 1.04303e-02 ± 7.18206e-04
  CSA_P2  : -5.81396e-05 ± 1.09374e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  7
 | N_BROKEN_FAST :  [48, 54, 59, 61, 66, 79, 99]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  7
 | P_BROKEN_FAST :  [12, 20, 31, 32, 37, 78, 81]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.4106', '1.800', '0.1676', '1.800', '0.0915', '7.000', '0.7081', 1, 1, 1, 1, 1726094446.421978]
VI_after__Init : ['1.201', '0.4088', '1.800', '0.1677', '1.800', '0.0863', '7.000', '0.7080', 1, 1, 1, 1, 1726094454.599353]
VI_at__the_End : ['1.201', '0.4810', '1.800', '0.1397', '1.800', '0.1167', '7.000', '0.7086', 1, 1, 1, 1, 1726094516.1946275]