TEST_NAME : Wafer
TEST_DATE : 24_09_12-13_40_29
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-025-011-009-14 | FUSED_ID : 6359364768399143070
  IC_TEMP :  -48.89 | VDDM : 1125.88 | AUX_INT :   -6.28 | CsaBias :   89.91
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 7.98392e-04 / 2
  ADC_P0  : -6.27872e-03 ± 1.91190e-02
  ADC_P1  : 8.07923e-03 ± 4.58659e-04
  ADC_P2  : -5.26786e-06 ± 2.17056e-06
  CSA_Chi2/NDF : 8.01589e-05 / 2
  CSA_P0  : 5.86442e-02 ± 5.97170e-03
  CSA_P1  : 9.34098e-03 ± 4.49925e-04
  CSA_P2  : -3.82414e-05 ± 6.85182e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  3
 | N_BROKEN_FAST :  [11, 33, 94]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  7
 | P_BROKEN_FAST :  [0, 15, 18, 27, 59, 61, 71]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.2593', '1.800', '0.1383', '1.800', '0.0906', '7.000', '0.7082', 1, 1, 1, 1, 1726141229.0280573]
VI_after__Init : ['1.202', '0.2595', '1.800', '0.1383', '1.800', '0.0852', '7.000', '0.7081', 1, 1, 1, 1, 1726141237.2754092]
VI_at__the_End : ['1.202', '0.4923', '1.800', '0.1396', '1.799', '0.1121', '7.000', '0.7087', 1, 1, 1, 1, 1726141298.5076451]