TEST_NAME : Wafer
TEST_DATE : 24_09_12-17_01_09
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-025-017-020-10 | FUSED_ID : 6359364768399167818
  IC_TEMP :  -63.58 | VDDM : 1115.35 | AUX_INT :  -27.73 | CsaBias :   57.06
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 2.22671e-03 / 2
  ADC_P0  : -2.77262e-02 ± 3.31863e-02
  ADC_P1  : 8.54309e-03 ± 7.92487e-04
  ADC_P2  : -6.44418e-06 ± 3.77326e-06
  CSA_Chi2/NDF : 2.09597e-04 / 2
  CSA_P0  : 5.77770e-02 ± 9.65639e-03
  CSA_P1  : 1.01912e-02 ± 7.27539e-04
  CSA_P2  : -5.38046e-05 ± 1.10796e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  6
 | N_BROKEN_FAST :  [47, 60, 86, 96, 103, 121]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  9
 | P_BROKEN_FAST :  [5, 11, 16, 21, 46, 51, 55, 68, 118]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.2888', '1.800', '0.1555', '1.800', '0.0870', '7.000', '0.7081', 1, 1, 1, 1, 1726153269.10565]
VI_after__Init : ['1.202', '0.2887', '1.800', '0.1554', '1.800', '0.0818', '7.000', '0.7080', 1, 1, 1, 1, 1726153277.23607]
VI_at__the_End : ['1.202', '0.4843', '1.800', '0.1372', '1.799', '0.1163', '7.000', '0.7086', 1, 1, 1, 1, 1726153343.438806]