TEST_NAME : Wafer
TEST_DATE : 24_09_12-17_38_24
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-025-018-018-04 | FUSED_ID : 6359364768399171876
  IC_TEMP :  -58.98 | VDDM : 1112.56 | AUX_INT :  -27.01 | CsaBias :   54.04
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 2.01112e-03 / 2
  ADC_P0  : -2.70074e-02 ± 3.15265e-02
  ADC_P1  : 8.15908e-03 ± 7.31231e-04
  ADC_P2  : -5.47556e-06 ± 3.37930e-06
  CSA_Chi2/NDF : 1.82508e-04 / 2
  CSA_P0  : 5.97965e-02 ± 9.01079e-03
  CSA_P1  : 9.97314e-03 ± 6.78898e-04
  CSA_P2  : -4.90947e-05 ± 1.03388e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  5
 | N_BROKEN_FAST :  [9, 24, 43, 69, 92]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  5
 | P_BROKEN_FAST :  [26, 43, 58, 60, 123]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.2687', '1.800', '0.1832', '1.800', '0.0871', '7.000', '0.7077', 1, 1, 1, 1, 1726155504.2999825]
VI_after__Init : ['1.201', '0.2679', '1.800', '0.1835', '1.800', '0.0817', '7.000', '0.7076', 1, 1, 1, 1, 1726155512.3863754]
VI_at__the_End : ['1.202', '0.4903', '1.800', '0.1381', '1.800', '0.1149', '7.000', '0.7084', 1, 1, 1, 1, 1726155578.42919]