TEST_NAME : Wafer
TEST_DATE : 24_09_13-08_20_08
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-026-002-013-14 | FUSED_ID : 6359364768400154846
  IC_TEMP :  -55.35 | VDDM : 1123.15 | AUX_INT :   -6.50 | CsaBias :   83.50
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 9.57064e-04 / 2
  ADC_P0  : -6.49913e-03 ± 2.09778e-02
  ADC_P1  : 8.23647e-03 ± 5.19819e-04
  ADC_P2  : -5.00246e-06 ± 2.54662e-06
  CSA_Chi2/NDF : 1.58709e-04 / 2
  CSA_P0  : 5.80060e-02 ± 8.40278e-03
  CSA_P1  : 9.74654e-03 ± 6.33089e-04
  CSA_P2  : -4.60121e-05 ± 9.64120e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  0
 | N_BROKEN_FAST :  []
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  7
 | P_BROKEN_FAST :  [2, 23, 29, 34, 53, 57, 121]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3302', '1.800', '0.1526', '1.800', '0.0937', '7.000', '0.7080', 1, 1, 1, 1, 1726208408.4361107]
VI_after__Init : ['1.201', '0.3302', '1.800', '0.1527', '1.800', '0.0880', '7.000', '0.7079', 1, 1, 1, 1, 1726208416.7964785]
VI_at__the_End : ['1.201', '0.4857', '1.800', '0.1359', '1.800', '0.1148', '7.000', '0.7089', 1, 1, 1, 1, 1726208485.3430705]