TEST_NAME : Wafer
TEST_DATE : 24_09_13-08_23_23
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-026-002-015-14 | FUSED_ID : 6359364768400154878
  IC_TEMP :  -61.70 | VDDM : 1125.94 | AUX_INT :   -9.98 | CsaBias :   72.63
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.67134e-03 / 2
  ADC_P0  : -9.97561e-03 ± 2.77781e-02
  ADC_P1  : 8.30952e-03 ± 6.84253e-04
  ADC_P2  : -4.91181e-06 ± 3.37257e-06
  CSA_Chi2/NDF : 1.96206e-04 / 2
  CSA_P0  : 5.81394e-02 ± 9.34282e-03
  CSA_P1  : 1.02808e-02 ± 7.03914e-04
  CSA_P2  : -5.47532e-05 ± 1.07198e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  8
 | N_BROKEN_FAST :  [14, 15, 56, 58, 63, 91, 95, 108]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  6
 | P_BROKEN_FAST :  [40, 84, 88, 99, 102, 126]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.1782', '1.800', '0.1679', '1.800', '0.0869', '7.000', '0.7079', 1, 1, 1, 1, 1726208602.8307667]
VI_after__Init : ['1.202', '0.1777', '1.800', '0.1658', '1.800', '0.0818', '7.000', '0.7081', 1, 1, 1, 1, 1726208610.4302676]
VI_at__the_End : ['1.202', '0.4838', '1.800', '0.1352', '1.800', '0.1188', '7.000', '0.7090', 1, 1, 1, 1, 1726208680.3038974]