TEST_NAME : Wafer
TEST_DATE : 24_09_13-08_55_47
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-026-003-007-03 | FUSED_ID : 6359364768400158835
  IC_TEMP :  -60.08 | VDDM : 1122.09 | AUX_INT :   -9.15 | CsaBias :   76.35
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.25595e-03 / 2
  ADC_P0  : -9.14569e-03 ± 2.39476e-02
  ADC_P1  : 8.61829e-03 ± 5.89585e-04
  ADC_P2  : -6.88647e-06 ± 2.87932e-06
  CSA_Chi2/NDF : 1.42549e-04 / 2
  CSA_P0  : 5.71622e-02 ± 7.96350e-03
  CSA_P1  : 1.00571e-02 ± 5.99992e-04
  CSA_P2  : -4.75829e-05 ± 9.13717e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  6
 | N_BROKEN_FAST :  [1, 17, 45, 63, 84, 101]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  9
 | P_BROKEN_FAST :  [2, 15, 52, 60, 70, 74, 76, 90, 107]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.2138', '1.800', '0.1705', '1.800', '0.0868', '7.000', '0.7089', 1, 1, 1, 1, 1726210546.9438393]
VI_after__Init : ['1.201', '0.2138', '1.800', '0.1705', '1.800', '0.0795', '7.000', '0.7079', 1, 1, 1, 1, 1726210555.9282322]
VI_at__the_End : ['1.202', '0.4978', '1.800', '0.1383', '1.800', '0.1161', '7.000', '0.7086', 1, 1, 1, 1, 1726210623.968994]