TEST_NAME : Wafer
TEST_DATE : 24_09_13-08_49_18
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-026-003-011-03 | FUSED_ID : 6359364768400158899
  IC_TEMP :  -59.60 | VDDM : 1128.66 | AUX_INT :   -6.72 | CsaBias :   60.41
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 9.53812e-04 / 2
  ADC_P0  : -6.71645e-03 ± 2.09339e-02
  ADC_P1  : 8.43483e-03 ± 5.26823e-04
  ADC_P2  : -5.46901e-06 ± 2.62198e-06
  CSA_Chi2/NDF : 1.47979e-04 / 2
  CSA_P0  : 6.12553e-02 ± 8.11377e-03
  CSA_P1  : 9.95685e-03 ± 6.11314e-04
  CSA_P2  : -4.73078e-05 ± 9.30959e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  4
 | N_BROKEN_FAST :  [12, 29, 38, 78]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  5
 | P_BROKEN_FAST :  [12, 76, 100, 110, 127]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.4903', '1.800', '0.1717', '1.800', '0.0919', '7.000', '0.7079', 1, 1, 1, 1, 1726210158.0556085]
VI_after__Init : ['1.202', '0.4912', '1.800', '0.1720', '1.800', '0.0859', '7.000', '0.7081', 1, 1, 1, 1, 1726210166.904977]
VI_at__the_End : ['1.202', '0.4945', '1.800', '0.1432', '1.800', '0.1136', '7.000', '0.7086', 1, 1, 1, 1, 1726210234.3587613]