TEST_NAME : Wafer
TEST_DATE : 24_09_13-08_46_03
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
------------------------------------------------------------
------------------------------------------------------------
ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-026-003-013-03 | FUSED_ID : 6359364768400158931
  IC_TEMP :  -58.09 | VDDM : 1128.87 | AUX_INT :   -8.06 | CsaBias :   81.65
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.21445e-03 / 2
  ADC_P0  : -8.05985e-03 ± 2.36224e-02
  ADC_P1  : 8.21467e-03 ± 5.72322e-04
  ADC_P2  : -5.40257e-06 ± 2.74820e-06
  CSA_Chi2/NDF : 1.49923e-04 / 2
  CSA_P0  : 5.53955e-02 ± 8.16689e-03
  CSA_P1  : 9.32876e-03 ± 6.15316e-04
  CSA_P2  : -4.16458e-05 ± 9.37054e-06
------------------------------------------------------------
ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  5
 | N_BROKEN_FAST :  [20, 46, 66, 73, 112]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  11
 | P_BROKEN_FAST :  [20, 25, 34, 36, 68, 71, 75, 90, 94, 97, 126]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
------------------------------------------------------------
------------------------------------------------------------
VI_before_Init : ['1.202', '0.2214', '1.800', '0.1335', '1.800', '0.0908', '7.000', '0.7082', 1, 1, 1, 1, 1726209963.0035946]
VI_after__Init : ['1.202', '0.2215', '1.800', '0.1334', '1.800', '0.0851', '7.000', '0.7082', 1, 1, 1, 1, 1726209971.8378088]
VI_at__the_End : ['1.202', '0.4780', '1.800', '0.1339', '1.800', '0.1151', '7.000', '0.7087', 1, 1, 1, 1, 1726210040.007587]