TEST_NAME : Wafer
TEST_DATE : 24_09_13-08_33_07
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-026-003-021-04 | FUSED_ID : 6359364768400159060
  IC_TEMP :  -61.18 | VDDM : 1126.72 | AUX_INT :   -8.55 | CsaBias :   79.62
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.17707e-03 / 2
  ADC_P0  : -8.55189e-03 ± 2.32246e-02
  ADC_P1  : 8.88328e-03 ± 6.01908e-04
  ADC_P2  : -6.60370e-06 ± 3.09698e-06
  CSA_Chi2/NDF : 1.91487e-04 / 2
  CSA_P0  : 5.90402e-02 ± 9.22980e-03
  CSA_P1  : 1.05982e-02 ± 6.95399e-04
  CSA_P2  : -5.59795e-05 ± 1.05901e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  5
 | N_BROKEN_FAST :  [17, 38, 70, 78, 80]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  6
 | P_BROKEN_FAST :  [59, 61, 66, 82, 94, 99]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.2300', '1.800', '0.1511', '1.800', '0.0930', '7.000', '0.7083', 1, 1, 1, 1, 1726209187.3915162]
VI_after__Init : ['1.202', '0.2301', '1.800', '0.1510', '1.800', '0.0877', '7.000', '0.7079', 1, 1, 1, 1, 1726209195.4418406]
VI_at__the_End : ['1.202', '0.4998', '1.800', '0.1396', '1.800', '0.1161', '7.000', '0.7086', 1, 1, 1, 1, 1726209255.5782073]