TEST_NAME : Wafer
TEST_DATE : 24_09_13-09_02_16
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-026-004-009-11 | FUSED_ID : 6359364768400162971
  IC_TEMP :  -58.48 | VDDM : 1126.38 | AUX_INT :  -70.97 | CsaBias :   34.82
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 2.08243e-03 / 2
  ADC_P0  : -7.09746e-02 ± 3.52048e-02
  ADC_P1  : 8.90771e-03 ± 8.21959e-04
  ADC_P2  : -7.63137e-06 ± 3.78904e-06
  CSA_Chi2/NDF : 1.72680e-04 / 2
  CSA_P0  : 5.82964e-02 ± 8.76482e-03
  CSA_P1  : 1.00054e-02 ± 6.60366e-04
  CSA_P2  : -4.83041e-05 ± 1.00566e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  5
 | N_BROKEN_FAST :  [18, 19, 45, 80, 89]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  7
 | P_BROKEN_FAST :  [17, 29, 31, 51, 54, 60, 92]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.3628', '1.800', '0.1598', '1.800', '0.0971', '7.000', '0.7082', 1, 1, 1, 1, 1726210935.4209938]
VI_after__Init : ['1.202', '0.3628', '1.800', '0.1599', '1.800', '0.0916', '7.000', '0.7083', 1, 1, 1, 1, 1726210944.250462]
VI_at__the_End : ['1.202', '0.4933', '1.800', '0.1378', '1.800', '0.1175', '7.000', '0.7086', 1, 1, 1, 1, 1726211010.228262]