TEST_NAME : Wafer
TEST_DATE : 24_09_13-09_55_40
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-026-005-007-06 | FUSED_ID : 6359364768400167030
  IC_TEMP :  -54.89 | VDDM : 1129.71 | AUX_INT :   -6.06 | CsaBias :   80.96
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.02689e-03 / 2
  ADC_P0  : -6.05522e-03 ± 2.17523e-02
  ADC_P1  : 7.95787e-03 ± 5.23643e-04
  ADC_P2  : -4.34189e-06 ± 2.50137e-06
  CSA_Chi2/NDF : 1.74246e-04 / 2
  CSA_P0  : 5.84029e-02 ± 8.80448e-03
  CSA_P1  : 1.03808e-02 ± 6.63354e-04
  CSA_P2  : -5.36023e-05 ± 1.01021e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  10
 | N_BROKEN_FAST :  [18, 43, 49, 69, 79, 99, 104, 110, 120, 124]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  4
 | P_BROKEN_FAST :  [10, 21, 60, 99]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.4424', '1.800', '0.1648', '1.800', '0.0999', '7.000', '0.7081', 1, 1, 1, 1, 1726214140.4147995]
VI_after__Init : ['1.202', '0.4430', '1.800', '0.1649', '1.800', '0.0942', '7.000', '0.7078', 1, 1, 1, 1, 1726214148.5750926]
VI_at__the_End : ['1.202', '0.4962', '1.800', '0.1378', '1.800', '0.1141', '7.000', '0.7090', 1, 1, 1, 1, 1726214207.2699091]