TEST_NAME : Wafer
TEST_DATE : 24_09_13-09_42_42
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-026-005-015-06 | FUSED_ID : 6359364768400167158
  IC_TEMP :  -55.56 | VDDM : 1110.45 | AUX_INT :   -6.25 | CsaBias :   81.05
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 9.39452e-04 / 2
  ADC_P0  : -6.24799e-03 ± 2.07541e-02
  ADC_P1  : 7.99167e-03 ± 4.91196e-04
  ADC_P2  : -5.07849e-06 ± 2.30231e-06
  CSA_Chi2/NDF : 1.28412e-04 / 2
  CSA_P0  : 5.68661e-02 ± 7.55831e-03
  CSA_P1  : 9.95078e-03 ± 5.69464e-04
  CSA_P2  : -4.64325e-05 ± 8.67226e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  4
 | N_BROKEN_FAST :  [3, 12, 44, 104]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  5
 | P_BROKEN_FAST :  [22, 30, 40, 47, 96]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.1815', '1.800', '0.1606', '1.800', '0.0877', '7.000', '0.7079', 1, 1, 1, 1, 1726213362.2769058]
VI_after__Init : ['1.202', '0.1814', '1.800', '0.1604', '1.800', '0.0824', '7.000', '0.7081', 1, 1, 1, 1, 1726213370.2931893]
VI_at__the_End : ['1.202', '0.4952', '1.800', '0.1356', '1.801', '0.1120', '7.000', '0.7087', 1, 1, 1, 1, 1726213437.5382187]