TEST_NAME : Wafer
TEST_DATE : 24_09_13-10_05_23
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-026-006-005-08 | FUSED_ID : 6359364768400171096
  IC_TEMP :  -57.14 | VDDM : 1127.62 | AUX_INT :   -8.83 | CsaBias :   76.17
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.18634e-03 / 2
  ADC_P0  : -8.83027e-03 ± 2.33000e-02
  ADC_P1  : 8.56301e-03 ± 5.78657e-04
  ADC_P2  : -6.28052e-06 ± 2.85547e-06
  CSA_Chi2/NDF : 1.93428e-04 / 2
  CSA_P0  : 5.58392e-02 ± 9.27646e-03
  CSA_P1  : 1.02677e-02 ± 6.98915e-04
  CSA_P2  : -5.14310e-05 ± 1.06436e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  6
 | N_BROKEN_FAST :  [49, 60, 71, 106, 119, 124]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  4
 | P_BROKEN_FAST :  [25, 79, 87, 110]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.4001', '1.800', '0.1866', '1.800', '0.0990', '7.000', '0.7082', 1, 1, 1, 1, 1726214723.3629134]
VI_after__Init : ['1.202', '0.4005', '1.800', '0.1868', '1.800', '0.0931', '7.000', '0.7078', 1, 1, 1, 1, 1726214731.4593205]
VI_at__the_End : ['1.202', '0.4931', '1.800', '0.1415', '1.800', '0.1146', '7.000', '0.7090', 1, 1, 1, 1, 1726214791.3958223]