TEST_NAME : Wafer
TEST_DATE : 24_09_13-10_07_01
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-026-006-006-08 | FUSED_ID : 6359364768400171112
  IC_TEMP :  -52.33 | VDDM : 1127.04 | AUX_INT :   -4.44 | CsaBias :   84.75
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 7.65957e-04 / 2
  ADC_P0  : -4.44223e-03 ± 1.87469e-02
  ADC_P1  : 8.16368e-03 ± 4.61423e-04
  ADC_P2  : -5.02204e-06 ± 2.23741e-06
  CSA_Chi2/NDF : 1.32398e-04 / 2
  CSA_P0  : 5.86395e-02 ± 7.67473e-03
  CSA_P1  : 9.63354e-03 ± 5.78236e-04
  CSA_P2  : -4.20535e-05 ± 8.80584e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  8
 | N_BROKEN_FAST :  [10, 20, 44, 54, 71, 83, 85, 125]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  1
 | P_BROKEN_FAST :  [83]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.3408', '1.800', '0.1643', '1.800', '0.0887', '7.000', '0.7083', 1, 1, 1, 1, 1726214821.451604]
VI_after__Init : ['1.202', '0.3414', '1.800', '0.1643', '1.800', '0.0831', '7.000', '0.7082', 1, 1, 1, 1, 1726214829.7190044]
VI_at__the_End : ['1.202', '0.4970', '1.800', '0.1400', '1.800', '0.1125', '7.000', '0.7089', 1, 1, 1, 1, 1726214893.5431144]