TEST_NAME : Wafer
TEST_DATE : 24_09_13-10_08_38
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-026-006-007-08 | FUSED_ID : 6359364768400171128
  IC_TEMP :  -56.88 | VDDM : 1124.15 | AUX_INT :   -7.42 | CsaBias :   76.71
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 9.71313e-04 / 2
  ADC_P0  : -7.41840e-03 ± 2.11155e-02
  ADC_P1  : 8.46807e-03 ± 5.30252e-04
  ADC_P2  : -5.55641e-06 ± 2.64171e-06
  CSA_Chi2/NDF : 1.94625e-04 / 2
  CSA_P0  : 5.84244e-02 ± 9.30512e-03
  CSA_P1  : 1.03701e-02 ± 7.01074e-04
  CSA_P2  : -5.17889e-05 ± 1.06765e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  9
 | N_BROKEN_FAST :  [2, 4, 17, 20, 36, 42, 67, 73, 86]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  11
 | P_BROKEN_FAST :  [3, 8, 19, 29, 56, 76, 96, 102, 112, 119, 120]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.3385', '1.800', '0.1606', '1.800', '0.0953', '7.000', '0.7079', 1, 1, 1, 1, 1726214917.8333423]
VI_after__Init : ['1.202', '0.3386', '1.800', '0.1606', '1.800', '0.0894', '7.000', '0.7078', 1, 1, 1, 1, 1726214925.9678104]
VI_at__the_End : ['1.202', '0.4994', '1.800', '0.1422', '1.800', '0.1135', '7.000', '0.7089', 1, 1, 1, 1, 1726214993.4887831]