TEST_NAME : Wafer
TEST_DATE : 24_09_13-10_15_07
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-026-006-011-08 | FUSED_ID : 6359364768400171192
  IC_TEMP :  -53.45 | VDDM : 1130.95 | AUX_INT :   -8.36 | CsaBias :   78.72
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.32828e-03 / 2
  ADC_P0  : -8.36334e-03 ± 2.47233e-02
  ADC_P1  : 7.97278e-03 ± 5.80440e-04
  ADC_P2  : -5.07721e-06 ± 2.70436e-06
  CSA_Chi2/NDF : 1.00472e-04 / 2
  CSA_P0  : 5.73009e-02 ± 6.68567e-03
  CSA_P1  : 9.49417e-03 ± 5.03717e-04
  CSA_P2  : -4.18745e-05 ± 7.67102e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  8
 | N_BROKEN_FAST :  [18, 20, 55, 63, 81, 95, 102, 115]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  7
 | P_BROKEN_FAST :  [32, 33, 37, 42, 81, 96, 110]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.2172', '1.800', '0.1652', '1.800', '0.0878', '7.000', '0.7090', 1, 1, 1, 1, 1726215307.130185]
VI_after__Init : ['1.202', '0.2171', '1.800', '0.1647', '1.800', '0.0803', '7.000', '0.7079', 1, 1, 1, 1, 1726215315.2345722]
VI_at__the_End : ['1.202', '0.4878', '1.800', '0.1363', '1.800', '0.1123', '7.000', '0.7087', 1, 1, 1, 1, 1726215375.3749783]