TEST_NAME : Wafer
TEST_DATE : 24_09_13-10_16_44
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-026-006-012-08 | FUSED_ID : 6359364768400171208
  IC_TEMP :  -60.61 | VDDM : 1106.35 | AUX_INT :   -7.15 | CsaBias :   73.03
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.25260e-03 / 2
  ADC_P0  : -7.15060e-03 ± 2.39752e-02
  ADC_P1  : 8.07241e-03 ± 5.67522e-04
  ADC_P2  : -5.46688e-06 ± 2.65761e-06
  CSA_Chi2/NDF : 1.34217e-04 / 2
  CSA_P0  : 5.64116e-02 ± 7.72728e-03
  CSA_P1  : 9.67845e-03 ± 5.82195e-04
  CSA_P2  : -4.60787e-05 ± 8.86614e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  5
 | N_BROKEN_FAST :  [0, 40, 47, 50, 60]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  5
 | P_BROKEN_FAST :  [18, 28, 47, 107, 124]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.3459', '1.800', '0.1232', '1.800', '0.0899', '7.000', '0.7080', 1, 1, 1, 1, 1726215404.0598989]
VI_after__Init : ['1.202', '0.3460', '1.800', '0.1233', '1.800', '0.0845', '7.000', '0.7081', 1, 1, 1, 1, 1726215412.1952653]
VI_at__the_End : ['1.202', '0.4771', '1.800', '0.1361', '1.800', '0.1142', '7.000', '0.7086', 1, 1, 1, 1, 1726215473.2586503]