TEST_NAME : Wafer
TEST_DATE : 24_09_13-10_19_59
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-026-006-014-08 | FUSED_ID : 6359364768400171240
  IC_TEMP :  -56.17 | VDDM : 1127.75 | AUX_INT :   -8.69 | CsaBias :   75.48
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.41553e-03 / 2
  ADC_P0  : -8.68805e-03 ± 2.54625e-02
  ADC_P1  : 8.48022e-03 ± 6.21542e-04
  ADC_P2  : -6.31900e-06 ± 3.01939e-06
  CSA_Chi2/NDF : 1.10468e-04 / 2
  CSA_P0  : 6.00372e-02 ± 7.01037e-03
  CSA_P1  : 9.66905e-03 ± 5.28181e-04
  CSA_P2  : -4.41897e-05 ± 8.04357e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  5
 | N_BROKEN_FAST :  [37, 38, 66, 107, 122]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  7
 | P_BROKEN_FAST :  [5, 8, 71, 101, 104, 105, 110]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.4583', '1.800', '0.1243', '1.800', '0.0991', '7.000', '0.7078', 1, 1, 1, 1, 1726215598.7205672]
VI_after__Init : ['1.202', '0.4586', '1.800', '0.1243', '1.800', '0.0936', '7.000', '0.7079', 1, 1, 1, 1, 1726215606.8458343]
VI_at__the_End : ['1.202', '0.4901', '1.800', '0.1396', '1.800', '0.1123', '7.000', '0.7090', 1, 1, 1, 1, 1726215674.1212392]