TEST_NAME : Wafer
TEST_DATE : 24_09_13-10_50_46
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
------------------------------------------------------------
------------------------------------------------------------
ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-026-007-020-02 | FUSED_ID : 6359364768400175426
  IC_TEMP :  -48.33 | VDDM : 1112.26 | AUX_INT :   -7.83 | CsaBias :   83.37
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.14212e-03 / 2
  ADC_P0  : -7.83265e-03 ± 2.29234e-02
  ADC_P1  : 8.34954e-03 ± 5.68786e-04
  ADC_P2  : -5.27946e-06 ± 2.80247e-06
  CSA_Chi2/NDF : 1.15759e-04 / 2
  CSA_P0  : 5.98886e-02 ± 7.17630e-03
  CSA_P1  : 9.81866e-03 ± 5.40682e-04
  CSA_P2  : -4.45135e-05 ± 8.23395e-06
------------------------------------------------------------
ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  10
 | N_BROKEN_FAST :  [6, 44, 49, 60, 65, 81, 83, 86, 88, 94]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  9
 | P_BROKEN_FAST :  [19, 27, 53, 54, 56, 61, 62, 84, 121]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
------------------------------------------------------------
------------------------------------------------------------
VI_before_Init : ['1.202', '0.4305', '1.800', '0.1663', '1.800', '0.0952', '7.000', '0.7086', 1, 1, 1, 1, 1726217445.6422956]
VI_after__Init : ['1.202', '0.4307', '1.800', '0.1664', '1.800', '0.0878', '7.000', '0.7083', 1, 1, 1, 1, 1726217454.4415312]
VI_at__the_End : ['1.202', '0.5003', '1.800', '0.1412', '1.800', '0.1106', '7.000', '0.7090', 1, 1, 1, 1, 1726217513.7769442]