TEST_NAME : Wafer
TEST_DATE : 24_09_13-10_47_32
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
------------------------------------------------------------
------------------------------------------------------------
ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-026-007-022-02 | FUSED_ID : 6359364768400175458
  IC_TEMP :  -50.92 | VDDM : 1125.87 | AUX_INT :   -8.80 | CsaBias :   73.48
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.39379e-03 / 2
  ADC_P0  : -8.79915e-03 ± 2.53330e-02
  ADC_P1  : 8.28203e-03 ± 6.17839e-04
  ADC_P2  : -5.37575e-06 ± 2.99707e-06
  CSA_Chi2/NDF : 1.03583e-04 / 2
  CSA_P0  : 5.93818e-02 ± 6.78839e-03
  CSA_P1  : 9.36357e-03 ± 5.11456e-04
  CSA_P2  : -4.05689e-05 ± 7.78887e-06
------------------------------------------------------------
ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  7
 | N_BROKEN_FAST :  [41, 43, 61, 71, 88, 102, 105]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  9
 | P_BROKEN_FAST :  [10, 82, 98, 102, 104, 122, 123, 124, 126]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
------------------------------------------------------------
------------------------------------------------------------
VI_before_Init : ['1.202', '0.4170', '1.800', '0.1442', '1.800', '0.0940', '7.000', '0.7081', 1, 1, 1, 1, 1726217251.3971477]
VI_after__Init : ['1.202', '0.4164', '1.800', '0.1439', '1.800', '0.0888', '7.000', '0.7079', 1, 1, 1, 1, 1726217260.2893577]
VI_at__the_End : ['1.202', '0.4860', '1.800', '0.1370', '1.800', '0.1111', '7.000', '0.7087', 1, 1, 1, 1, 1726217327.0352786]