TEST_NAME : Wafer
TEST_DATE : 24_09_13-11_27_54
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-026-008-007-01 | FUSED_ID : 6359364768400179313
  IC_TEMP :  -52.64 | VDDM : 1127.31 | AUX_INT :  -25.86 | CsaBias :   68.62
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.41350e-03 / 2
  ADC_P0  : -2.58636e-02 ± 2.64020e-02
  ADC_P1  : 8.66051e-03 ± 6.46442e-04
  ADC_P2  : -6.48473e-06 ± 3.14488e-06
  CSA_Chi2/NDF : 1.52066e-04 / 2
  CSA_P0  : 6.00805e-02 ± 8.22505e-03
  CSA_P1  : 1.00920e-02 ± 6.19698e-04
  CSA_P2  : -4.77334e-05 ± 9.43727e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  6
 | N_BROKEN_FAST :  [14, 36, 65, 76, 82, 83]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  2
 | P_BROKEN_FAST :  [48, 87]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.4281', '1.800', '0.1884', '1.800', '0.0883', '7.007', '0.7083', 1, 1, 1, 1, 1726219673.4385903]
VI_after__Init : ['1.202', '0.4285', '1.800', '0.1886', '1.800', '0.0828', '7.003', '0.7076', 1, 1, 1, 1, 1726219682.269835]
VI_at__the_End : ['1.202', '0.4999', '1.800', '0.1414', '1.800', '0.1128', '7.000', '0.7090', 1, 1, 1, 1, 1726219742.2122383]