TEST_NAME : Wafer
TEST_DATE : 24_09_13-11_32_46
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
------------------------------------------------------------
------------------------------------------------------------
ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-026-008-010-01 | FUSED_ID : 6359364768400179361
  IC_TEMP :  -52.74 | VDDM : 1134.63 | AUX_INT :   -6.40 | CsaBias :   83.47
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 8.56690e-04 / 2
  ADC_P0  : -6.40135e-03 ± 1.98534e-02
  ADC_P1  : 8.22182e-03 ± 4.93624e-04
  ADC_P2  : -4.70416e-06 ± 2.43206e-06
  CSA_Chi2/NDF : 1.20474e-04 / 2
  CSA_P0  : 6.00381e-02 ± 7.32097e-03
  CSA_P1  : 9.80871e-03 ± 5.51582e-04
  CSA_P2  : -4.36748e-05 ± 8.39994e-06
------------------------------------------------------------
ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  8
 | N_BROKEN_FAST :  [8, 30, 32, 37, 39, 54, 55, 122]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  9
 | P_BROKEN_FAST :  [9, 28, 29, 52, 78, 85, 93, 106, 115]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
------------------------------------------------------------
------------------------------------------------------------
VI_before_Init : ['1.202', '0.2673', '1.800', '0.1754', '1.799', '0.0869', '6.999', '0.7083', 1, 1, 1, 1, 1726219965.970862]
VI_after__Init : ['1.202', '0.2673', '1.800', '0.1754', '1.800', '0.0812', '6.999', '0.7082', 1, 1, 1, 1, 1726219974.2522283]
VI_at__the_End : ['1.202', '0.4986', '1.800', '0.1400', '1.800', '0.1115', '7.004', '0.7090', 1, 1, 1, 1, 1726220038.693227]