TEST_NAME : Wafer
TEST_DATE : 24_09_13-11_34_23
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-026-008-011-01 | FUSED_ID : 6359364768400179377
  IC_TEMP :  -52.12 | VDDM : 1117.40 | AUX_INT :   -7.50 | CsaBias :   75.76
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.23142e-03 / 2
  ADC_P0  : -7.50143e-03 ± 2.37849e-02
  ADC_P1  : 8.38232e-03 ± 5.86949e-04
  ADC_P2  : -5.58831e-06 ± 2.87840e-06
  CSA_Chi2/NDF : 1.32885e-04 / 2
  CSA_P0  : 5.93470e-02 ± 7.68883e-03
  CSA_P1  : 1.00053e-02 ± 5.79298e-04
  CSA_P2  : -4.82559e-05 ± 8.82202e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  4
 | N_BROKEN_FAST :  [25, 28, 113, 126]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  7
 | P_BROKEN_FAST :  [14, 56, 58, 73, 77, 97, 100]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.3047', '1.800', '0.1449', '1.800', '0.1005', '7.007', '0.7090', 1, 1, 1, 1, 1726220062.923343]
VI_after__Init : ['1.202', '0.3052', '1.800', '0.1444', '1.800', '0.0933', '6.999', '0.7082', 1, 1, 1, 1, 1726220070.9915996]
VI_at__the_End : ['1.202', '0.4935', '1.800', '0.1387', '1.800', '0.1128', '7.000', '0.7089', 1, 1, 1, 1, 1726220130.2901545]