TEST_NAME : Wafer
TEST_DATE : 24_09_13-11_37_36
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
------------------------------------------------------------
------------------------------------------------------------
ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-026-008-013-01 | FUSED_ID : 6359364768400179409
  IC_TEMP :  -51.18 | VDDM : 1128.79 | AUX_INT :   -5.82 | CsaBias :   74.40
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 9.23557e-04 / 2
  ADC_P0  : -5.82223e-03 ± 2.06090e-02
  ADC_P1  : 8.07083e-03 ± 5.01289e-04
  ADC_P2  : -4.84353e-06 ± 2.40455e-06
  CSA_Chi2/NDF : 8.55267e-05 / 2
  CSA_P0  : 6.01009e-02 ± 6.16841e-03
  CSA_P1  : 9.20165e-03 ± 4.64745e-04
  CSA_P2  : -3.65771e-05 ± 7.07752e-06
------------------------------------------------------------
ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  6
 | N_BROKEN_FAST :  [32, 97, 104, 116, 120, 124]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  6
 | P_BROKEN_FAST :  [60, 61, 69, 74, 104, 110]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
------------------------------------------------------------
------------------------------------------------------------
VI_before_Init : ['1.202', '0.3993', '1.800', '0.1496', '1.800', '0.0912', '7.000', '0.7079', 1, 1, 1, 1, 1726220256.6172721]
VI_after__Init : ['1.202', '0.3993', '1.800', '0.1496', '1.800', '0.0855', '7.000', '0.7082', 1, 1, 1, 1, 1726220264.7357035]
VI_at__the_End : ['1.202', '0.4913', '1.800', '0.1386', '1.800', '0.1105', '7.000', '0.7088', 1, 1, 1, 1, 1726220323.4281137]