TEST_NAME : Wafer
TEST_DATE : 24_09_13-11_40_51
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-026-008-015-01 | FUSED_ID : 6359364768400179441
  IC_TEMP :  -53.47 | VDDM : 1136.10 | AUX_INT :   -8.02 | CsaBias :   76.58
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.04579e-03 / 2
  ADC_P0  : -8.01559e-03 ± 2.18932e-02
  ADC_P1  : 8.51860e-03 ± 5.46741e-04
  ADC_P2  : -5.94095e-06 ± 2.71090e-06
  CSA_Chi2/NDF : 1.23223e-04 / 2
  CSA_P0  : 6.11194e-02 ± 7.40404e-03
  CSA_P1  : 1.00157e-02 ± 5.57841e-04
  CSA_P2  : -4.71205e-05 ± 8.49526e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  3
 | N_BROKEN_FAST :  [31, 55, 65]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  5
 | P_BROKEN_FAST :  [11, 81, 85, 118, 121]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.2389', '1.800', '0.1709', '1.800', '0.0837', '7.001', '0.7079', 1, 1, 1, 1, 1726220450.914305]
VI_after__Init : ['1.202', '0.2389', '1.800', '0.1709', '1.800', '0.0784', '7.000', '0.7083', 1, 1, 1, 1, 1726220459.0287423]
VI_at__the_End : ['1.202', '0.4988', '1.800', '0.1408', '1.800', '0.1119', '6.999', '0.7090', 1, 1, 1, 1, 1726220521.3029177]