TEST_NAME : Wafer
TEST_DATE : 24_09_13-11_44_05
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-026-008-017-06 | FUSED_ID : 6359364768400179478
  IC_TEMP :  -54.91 | VDDM : 1131.19 | AUX_INT :   -5.78 | CsaBias :   94.17
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 7.16308e-04 / 2
  ADC_P0  : -5.78424e-03 ± 1.80713e-02
  ADC_P1  : 8.40271e-03 ± 4.44304e-04
  ADC_P2  : -6.06974e-06 ± 2.16006e-06
  CSA_Chi2/NDF : 9.04523e-05 / 2
  CSA_P0  : 5.95976e-02 ± 6.34355e-03
  CSA_P1  : 9.65590e-03 ± 4.77941e-04
  CSA_P2  : -4.30527e-05 ± 7.27847e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  7
 | N_BROKEN_FAST :  [12, 26, 27, 39, 40, 62, 98]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  2
 | P_BROKEN_FAST :  [1, 91]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.1838', '1.800', '0.1464', '1.800', '0.0843', '7.000', '0.7089', 1, 1, 1, 1, 1726220644.911266]
VI_after__Init : ['1.202', '0.1839', '1.800', '0.1464', '1.800', '0.0769', '7.000', '0.7081', 1, 1, 1, 1, 1726220653.2116256]
VI_at__the_End : ['1.202', '0.4938', '1.800', '0.1385', '1.800', '0.1123', '7.000', '0.7090', 1, 1, 1, 1, 1726220716.1436617]